smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: TOSHIBA MK1032GSX Serial Number: 762E0424T Firmware Version: AS026B User Capacity: 100,030,242,816 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 6 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Wed May 21 16:52:22 2008 BST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 384) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 76) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1999 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 19368 5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 8 7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 085 085 000 Old_age Always - 6225 10 Spin_Retry_Count 0x0033 253 100 030 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1884 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 133 193 Load_Cycle_Count 0x0032 090 090 000 Old_age Always - 108729 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 31 (Lifetime Min/Max 11/46) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 8 197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 1 220 Disk_Shift 0x0002 100 100 000 Old_age Always - 183 222 Loaded_Hours 0x0032 087 087 000 Old_age Always - 5389 223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0 224 Load_Friction 0x0022 100 100 000 Old_age Always - 0 226 Load-in_Time 0x0026 100 100 000 Old_age Always - 340 240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0 SMART Error Log Version: 1 ATA Error Count: 22 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 22 occurred at disk power-on lifetime: 6224 hours (259 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 13 1d 9d a1 e2 Error: UNC 19 sectors at LBA = 0x02a19d1d = 44145949 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 a0 90 9c a1 e2 00 00:01:23.768 READ DMA 27 00 00 00 00 00 e0 00 00:01:23.768 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 00:01:23.759 IDENTIFY DEVICE ef 03 45 00 00 00 a0 00 00:01:23.752 SET FEATURES [Set transfer mode] 27 00 00 00 00 00 e0 00 00:01:23.752 READ NATIVE MAX ADDRESS EXT Error 21 occurred at disk power-on lifetime: 6224 hours (259 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 13 1d 9d a1 e2 Error: UNC 19 sectors at LBA = 0x02a19d1d = 44145949 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 a0 90 9c a1 e2 00 00:01:17.004 READ DMA 27 00 00 00 00 00 e0 00 00:01:17.004 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 00:01:16.996 IDENTIFY DEVICE ef 03 45 00 00 00 a0 00 00:01:16.996 SET FEATURES [Set transfer mode] 27 00 00 00 00 00 e0 00 00:01:16.996 READ NATIVE MAX ADDRESS EXT Error 20 occurred at disk power-on lifetime: 6224 hours (259 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 13 1d 9d a1 e2 Error: UNC 19 sectors at LBA = 0x02a19d1d = 44145949 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 a0 90 9c a1 e2 00 00:01:10.256 READ DMA 27 00 00 00 00 00 e0 00 00:01:10.256 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 00:01:10.248 IDENTIFY DEVICE ef 03 45 00 00 00 a0 00 00:01:10.240 SET FEATURES [Set transfer mode] 27 00 00 00 00 00 e0 00 00:01:10.240 READ NATIVE MAX ADDRESS EXT Error 19 occurred at disk power-on lifetime: 6224 hours (259 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 13 1d 9d a1 e2 Error: UNC 19 sectors at LBA = 0x02a19d1d = 44145949 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 a0 90 9c a1 e2 00 00:01:03.494 READ DMA 27 00 00 00 00 00 e0 00 00:01:03.493 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 00:01:03.485 IDENTIFY DEVICE ef 03 45 00 00 00 a0 00 00:01:03.485 SET FEATURES [Set transfer mode] 27 00 00 00 00 00 e0 00 00:01:03.484 READ NATIVE MAX ADDRESS EXT Error 18 occurred at disk power-on lifetime: 6224 hours (259 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 13 1d 9d a1 e2 Error: UNC 19 sectors at LBA = 0x02a19d1d = 44145949 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 a0 90 9c a1 e2 00 00:00:56.737 READ DMA 27 00 00 00 00 00 e0 00 00:00:56.737 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 00:00:56.729 IDENTIFY DEVICE ef 03 45 00 00 00 a0 00 00:00:56.722 SET FEATURES [Set transfer mode] 27 00 00 00 00 00 e0 00 00:00:56.697 READ NATIVE MAX ADDRESS EXT SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.