smartctl version 5.38 [i486-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG HM160HI Serial Number: S14QJD0Q454828 Firmware Version: HH100-11 User Capacity: 160,041,885,696 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 Local Time is: Thu Aug 13 17:47:32 2009 UTC ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: FAILED! Drive failure expected in less than 24 hours. SAVE ALL DATA. See vendor-specific Attribute list for failed Attributes. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 32) The self-test routine was interrupted by the host with a hard or soft reset. Total time to complete Offline data collection: ( 62) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 62) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 3127 3 Spin_Up_Time 0x0007 252 252 025 Pre-fail Always - 2062 4 Start_Stop_Count 0x0032 098 098 000 Old_age Always - 24635 5 Reallocated_Sector_Ct 0x0033 001 001 010 Pre-fail Always FAILING_NOW 949 9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 2037 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1899 191 G-Sense_Error_Rate 0x0032 077 077 000 Old_age Always - 233545 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 197 194 Temperature_Celsius 0x0022 121 079 000 Old_age Always - 39 (Lifetime Min/Max 7/53) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 116992 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 1808 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 5554 199 UDMA_CRC_Error_Count 0x0036 252 252 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 252 252 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Aborted by host 150% 214 - # 2 Short offline Completed without error 00% 6 - # 3 Short offline Completed without error 00% 5 - # 4 Short offline Aborted by host 150% 4 - SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Interrupted [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.