smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Model Family: Hitachi Travelstar 80GN family Device Model: IC25N020ATMR04-0 Serial Number: MRG157K1H3M1RH Firmware Version: MO1OAD0A User Capacity: 20,003,880,960 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 6 ATA Standard is: ATA/ATAPI-6 T13 1410D revision 3a Local Time is: Sat Oct 16 22:17:46 2010 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: FAILED! Drive failure expected in less than 24 hours. SAVE ALL DATA. See vendor-specific Attribute list for failed Attributes. General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 645) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 21) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0 2 Throughput_Performance 0x0005 105 105 040 Pre-fail Offline - 5863 3 Spin_Up_Time 0x0007 019 019 033 Pre-fail Always FAILING_NOW 1 4 Start_Stop_Count 0x0012 098 098 000 Old_age Always - 4075 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 120 120 040 Pre-fail Offline - 36 9 Power_On_Hours 0x0012 039 039 000 Old_age Always - 27087 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 3850 191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 65536 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 102 193 Load_Cycle_Count 0x0012 038 038 000 Old_age Always - 626289 194 Temperature_Celsius 0x0002 152 152 000 Old_age Always - 36 (8 238 255 254) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 58 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 21339 hours (889 days + 3 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 80 29 54 e2 Error: IDNF 1 sectors at LBA = 0x02542980 = 39070080 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 80 29 54 e2 00 07:12:50.200 READ DMA e7 00 00 00 00 00 a0 00 07:12:50.200 FLUSH CACHE e7 00 00 00 00 00 a0 00 07:12:50.100 FLUSH CACHE ca 00 08 47 00 5e e0 00 07:12:50.100 WRITE DMA c8 00 08 bf ec 60 e0 00 07:12:49.700 READ DMA Error 1 occurred at disk power-on lifetime: 18785 hours (782 days + 17 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 80 29 54 e2 Error: IDNF 1 sectors at LBA = 0x02542980 = 39070080 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 80 29 54 e2 00 02:42:32.100 READ DMA e7 00 00 00 00 00 a0 00 02:42:32.000 FLUSH CACHE e7 00 00 00 00 00 a0 00 02:42:31.600 FLUSH CACHE ca 00 08 47 00 5e e0 00 02:42:31.600 WRITE DMA ca 00 08 4f d1 5e e0 00 02:42:31.600 WRITE DMA SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 0 - Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.