root@1[knoppix]# smartctl -t long /dev/hda smartctl version 5.34 [i686-pc-linux-gnu] Copyright (C) 2002-5 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION === Sending command: "Execute SMART Extended self-test routine immediately in off-li ne mode". Drive command "Execute SMART Extended self-test routine immediately in off-line mode" successful. Testing has begun. Please wait 81 minutes for test to complete. Test will complete after Mon Nov 6 02:54:00 2006 Use smartctl -X to abort test. root@1[knoppix]# smartctl -a /dev/hda smartctl version 5.34 [i686-pc-linux-gnu] Copyright (C) 2002-5 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG SP2014N Serial Number: S088J10Y916999 Firmware Version: VC100-33 User Capacity: 200,049,647,616 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a Local Time is: Mon Nov 6 01:34:43 2006 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 121) The previous self-test completed having the read element of the test failed. Total time to complete Offline data collection: (4891) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off supp ort. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 81) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_ FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 253 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 5504 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 519 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0 9 Power_On_Half_Minutes 0x0032 100 100 000 Old_age Always - 54h+24m 10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 253 002 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 351 190 Unknown_Attribute 0x0022 124 094 000 Old_age Always - 38 194 Temperature_Celsius 0x0022 124 094 000 Old_age Always - 38 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 2267 196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 1 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 253 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 253 100 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 6527 hours (271 days + 23 hours) When the command that caused the error occurred, the device was active or idle . After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 02 51 00 00 00 00 a0 Error: TK0NF Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 10 00 00 00 00 00 a0 00 00:12:39.750 RECALIBRATE [OBS-4] 00 00 01 01 00 00 a0 00 00:12:39.625 NOP [Abort queued commands] ff 00 00 01 01 00 a0 00 00:06:22.563 [VENDOR SPECIFIC] b0 d9 01 01 4f c2 a0 00 00:06:15.875 SMART DISABLE OPERATIONS b0 d5 01 01 4f c2 a0 00 00:06:15.813 SMART READ LOG SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA _of_first_error # 1 Extended offline Completed: read failure 90% 6528 - # 2 Extended offline Completed: read failure 90% 6528 - SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revis ion number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. root@1[knoppix]# smartctl -a /dev/hda smartctl version 5.34 [i686-pc-linux-gnu] Copyright (C) 2002-5 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG SP2014N Serial Number: S088J10Y916999 Firmware Version: VC100-33 User Capacity: 200,049,647,616 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a Local Time is: Mon Nov 6 06:24:35 2006 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 121) The previous self-test completed having the read element of the test failed. Total time to complete Offline data collection: (4891) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off supp ort. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 81) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_ FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 253 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 5504 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 519 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0 9 Power_On_Half_Minutes 0x0032 100 100 000 Old_age Always - 54h+26m 10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 253 002 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 351 190 Unknown_Attribute 0x0022 124 094 000 Old_age Always - 38 194 Temperature_Celsius 0x0022 124 094 000 Old_age Always - 38 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 2267 196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 1 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 253 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 253 100 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 6527 hours (271 days + 23 hours) When the command that caused the error occurred, the device was active or idle . After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 02 51 00 00 00 00 a0 Error: TK0NF Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 10 00 00 00 00 00 a0 00 00:12:39.750 RECALIBRATE [OBS-4] 00 00 01 01 00 00 a0 00 00:12:39.625 NOP [Abort queued commands] ff 00 00 01 01 00 a0 00 00:06:22.563 [VENDOR SPECIFIC] b0 d9 01 01 4f c2 a0 00 00:06:15.875 SMART DISABLE OPERATIONS b0 d5 01 01 4f c2 a0 00 00:06:15.813 SMART READ LOG SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA _of_first_error # 1 Extended offline Completed: read failure 90% 6528 - # 2 Extended offline Completed: read failure 90% 6528 - SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revis ion number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. root@1[knoppix]#