smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG MP0804H Serial Number: S042J10XB49033 Firmware Version: UE100-14 User Capacity: 80,060,424,192 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 Local Time is: Sat Dec 9 21:54:07 2006 UTC ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 112) The previous self-test completed having the read element of the test failed. Total time to complete Offline data collection: (4800) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 80) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 3200 4 Start_Stop_Count 0x0032 098 098 000 Old_age Always - 2508 5 Reallocated_Sector_Ct 0x0033 099 099 011 Pre-fail Always - 3 7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 878447 10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1374 191 G-Sense_Error_Rate 0x0012 092 092 000 Old_age Always - 90744 194 Temperature_Celsius 0x0022 115 067 000 Old_age Always - 41 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 6673370 196 Reallocated_Event_Count 0x0032 098 098 000 Old_age Always - 6 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age Always - 0 201 Soft_Read_Error_Rate 0x0012 100 100 000 Old_age Always - 0 223 Load_Retry_Count 0x0012 092 092 000 Old_age Always - 8876 225 Load_Cycle_Count 0x0012 015 015 000 Old_age Always - 866619 255 Unknown_Attribute 0x000a 100 100 051 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 445 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 445 occurred at disk power-on lifetime: 5853 hours (243 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 5f 42 12 e3 Error: UNC 8 sectors at LBA = 0x0312425f = 51528287 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 5f 42 12 e3 00 01:26:10.375 READ DMA ca 00 28 2f fa 39 e4 00 01:26:10.375 WRITE DMA ca 00 58 d7 75 86 e4 00 01:26:10.375 WRITE DMA ca 00 08 c7 10 f8 e1 00 01:26:10.375 WRITE DMA c8 00 01 83 84 f2 e5 00 01:26:10.375 READ DMA Error 444 occurred at disk power-on lifetime: 5853 hours (243 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 5f 42 12 e3 Error: UNC 8 sectors at LBA = 0x0312425f = 51528287 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 5f 42 12 e3 00 01:26:09.000 READ DMA c8 00 01 00 00 00 e0 00 01:26:09.000 READ DMA ca 00 80 57 75 86 e4 00 01:26:09.000 WRITE DMA ca 00 08 df 00 00 e0 00 01:26:09.000 WRITE DMA c8 00 01 00 00 00 e0 00 01:26:08.938 READ DMA Error 443 occurred at disk power-on lifetime: 5853 hours (243 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 5f 42 12 e3 Error: UNC 8 sectors at LBA = 0x0312425f = 51528287 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 5f 42 12 e3 00 01:26:07.625 READ DMA c8 00 01 00 00 00 e0 00 01:26:07.625 READ DMA ca 00 08 c7 a3 01 e0 00 01:26:07.625 WRITE DMA Error 442 occurred at disk power-on lifetime: 5853 hours (243 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 5f 42 12 e3 Error: UNC 8 sectors at LBA = 0x0312425f = 51528287 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 5f 42 12 e3 00 01:26:06.250 READ DMA c8 00 08 4f 42 12 e3 00 01:26:06.250 READ DMA c8 00 08 3f 42 12 e3 00 01:26:06.250 READ DMA c8 00 08 57 c4 e9 e0 00 01:26:06.125 READ DMA c8 00 08 47 c4 e9 e0 00 01:26:06.125 READ DMA Error 441 occurred at disk power-on lifetime: 5853 hours (243 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 5f 42 12 e3 Error: UNC 8 sectors at LBA = 0x0312425f = 51528287 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 5f 42 12 e3 00 01:23:10.625 READ DMA c8 00 01 48 f9 b9 e4 00 01:23:10.625 READ DMA SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed: read failure 00% 7317 51528287 # 2 Extended offline Completed: read failure 00% 7316 51528287 SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.